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Rozptyl Koridor Není to složité gabor gyepes sram reliability Platnost vypršela implicitní stačí

2011 IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2011) : Cottbus
2011 IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2011) : Cottbus

IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC SUPPLY CURRENT
IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC SUPPLY CURRENT

PDF) Dynamic power supply current test for CMOS SRAM
PDF) Dynamic power supply current test for CMOS SRAM

An embedded IDDQ testing circuit and technique | Semantic Scholar
An embedded IDDQ testing circuit and technique | Semantic Scholar

PDF) Internal Write-Back and Read-Before-Write Schemes to Eliminate the Disturbance to the Half-Selected Cells in SRAMs
PDF) Internal Write-Back and Read-Before-Write Schemes to Eliminate the Disturbance to the Half-Selected Cells in SRAMs

PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar
PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar

IEEE Paper Template in A4 (V1)
IEEE Paper Template in A4 (V1)

PDF) Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison Between 0.13 um and 90 nm Technologies
PDF) Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison Between 0.13 um and 90 nm Technologies

Ľudia na STU - Ing. Gábor Gyepes, PhD.
Ľudia na STU - Ing. Gábor Gyepes, PhD.

Waveforms of simulations (defect 4) | Download Scientific Diagram
Waveforms of simulations (defect 4) | Download Scientific Diagram

IEEE Paper Template in A4 (V1)
IEEE Paper Template in A4 (V1)

Application of IDDT test towards increasing SRAM reliability in nanometer technologies | Request PDF
Application of IDDT test towards increasing SRAM reliability in nanometer technologies | Request PDF

An embedded IDDQ testing circuit and technique | Semantic Scholar
An embedded IDDQ testing circuit and technique | Semantic Scholar

Waveforms of simulations (defect 4) | Download Scientific Diagram
Waveforms of simulations (defect 4) | Download Scientific Diagram

IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC SUPPLY CURRENT
IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC SUPPLY CURRENT

IEEE Paper Template in A4 (V1)
IEEE Paper Template in A4 (V1)

Fault detection as a function of the cycle time, defect size and number... | Download Scientific Diagram
Fault detection as a function of the cycle time, defect size and number... | Download Scientific Diagram

Waveforms of simulations (defect 4) | Download Scientific Diagram
Waveforms of simulations (defect 4) | Download Scientific Diagram

IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC SUPPLY CURRENT
IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC SUPPLY CURRENT

Application of IDDT test towards increasing SRAM reliability in nanometer technologies | Request PDF
Application of IDDT test towards increasing SRAM reliability in nanometer technologies | Request PDF

Waveforms of simulations (defect 2) | Download Scientific Diagram
Waveforms of simulations (defect 2) | Download Scientific Diagram

PDF) IOSR journal of VLSI and Signal Processing | IOSR Journals - Academia.edu
PDF) IOSR journal of VLSI and Signal Processing | IOSR Journals - Academia.edu

IEEE Paper Template in A4 (V1)
IEEE Paper Template in A4 (V1)